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- Table 1 from A New Method for Generating Tests for Delay Faults in Non-Scan Circuits | Semantic ...
- Table 1 from A New Method for Generating Tests for Delay Faults in Non-Scan Circuits | Semantic ...
- Figure 1 from Generating tests for delay faults in nonscan circuits | Semantic Scholar
- Table 2 from Generating tests for delay faults in nonscan circuits | Semantic Scholar
- Figure 1 from Generating tests for delay faults in nonscan circuits | Semantic Scholar
- Figure 1 from Generating tests for delay faults in nonscan circuits | Semantic Scholar
- Table 1 from Generating tests for delay faults in nonscan circuits | Semantic Scholar
- (PDF) Scan tests with multiple fault activation cycles for delay faults
- Figure 1 from Diagnosing Transition Delay Faults under Scan-Based Logic Array | Semantic Scholar
- Figure 1 from Diagnosing Transition Delay Faults under Scan-Based Logic Array | Semantic Scholar